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TotScatCalculateSelfScattering v1
Calculates the self scattering correction factor for total scattering data.
Name |
Direction |
Type |
Default |
Description |
InputWorkspace |
Input |
Workspace |
Mandatory |
Raw workspace. |
OutputWorkspace |
Output |
Workspace |
Mandatory |
Focused corrected workspace. |
CalFileName |
Input |
string |
Mandatory |
File path for the instrument calibration file. |
SampleGeometry |
Input |
Dictionary |
null |
Geometry of the sample material. |
SampleMaterial |
Input |
Dictionary |
null |
Chemical formula for the sample material. |
CrystalDensity |
Input |
number |
0 |
The crystalographic density of the material. |
This is a workflow algorithm that calculates the placzek self scattering
factor focused into detector banks. This is done by executing several
sub-algorithms as listed below.
- SetSample v1 Sets sample data for the run that is to be corrected to the raw workspace.
- ExtractSpectra v1 Extracts the monitor spectrum closest to the sample (incident spectrum).
- ConvertUnits v1 Converts incident spectrum to wavelength.
- FitIncidentSpectrum v1 Fit a curve to the incident spectrum.
- CalculatePlaczekSelfScattering v2 Calculate the Placzek self scattering factor for each pixel.
- ConvertUnits v1 Convert the Placzek correction into MomentumTransfer
- Rebin v1 Rebin correction before GroupDetectors.
- LoadCalFile v1 Loads the detector calibration.
- GroupDetectors v2 Group the Placzek self scattering factor into detector banks.
- CreateWorkspace v1 Create a workspace containing the number of pixels in each detector bank.
- Divide v1 Normalize the Placzek correction by pixel number in bank