\(\renewcommand\AA{\unicode{x212B}}\)

TotScatCalculateSelfScattering v1¶

Summary ¶

Calculates the self scattering correction factor for total scattering data.

Properties ¶

Name	Direction	Type	Default	Description
InputWorkspace	Input	Workspace	Mandatory	Raw workspace.
OutputWorkspace	Output	Workspace	Mandatory	Focused corrected workspace.
CalFileName	Input	string	Mandatory	File path for the instrument calibration file.
SampleGeometry	Input	Dictionary	null	Geometry of the sample material.
SampleMaterial	Input	Dictionary	null	Chemical formula for the sample material.
PlaczekOrder	Input	number	1	Placzek correction order to be used.
SampleTemp	Input	string		Sample Temperature in Kelvin. Required for 2nd order Placzek correction if not using Sample Logs.
ApplyPerDetector	Input	boolean	False	Apply the correction to unfocussed data.

Description ¶

This is a workflow algorithm that calculates the placzek self scattering factor focused into detector banks. This is done by executing several sub-algorithms as listed below.

SetSample v1 Sets sample data for the run that is to be corrected to the raw workspace.
ExtractSpectra v1 Extracts the monitor spectrum closest to the sample (incident spectrum).
ConvertUnits v1 Converts incident spectrum to wavelength.
FitIncidentSpectrum v1 Fit a curve to the incident spectrum.
CalculatePlaczek v1 Calculate the Placzek self scattering factor for each pixel.
ConvertUnits v1 Convert the Placzek correction into MomentumTransfer
Rebin v1 Rebin correction before GroupDetectors.
LoadCalFile v1 Loads the detector calibration.
GroupDetectors v2 Group the Placzek self scattering factor into detector banks.
CreateWorkspace v1 Create a workspace containing the number of pixels in each detector bank.
Divide v1 Normalize the Placzek correction by pixel number in bank